Analysis of Latchup susceptibility to internal logical states by using a Laser beam - Archive ouverte HAL Access content directly
Journal Articles Microelectronic Engineering Year : 1996
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hal-00185406 , version 1 (06-11-2007)

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  • HAL Id : hal-00185406 , version 1

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Pascal Fouillat, Hervé Lapuyade, Yvan Maidon, Jean-Paul Dom. Analysis of Latchup susceptibility to internal logical states by using a Laser beam. Microelectronic Engineering, 1996, 31, pp.1. ⟨hal-00185406⟩
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