Journal Articles
Microelectronic Engineering
Year : 1996
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https://hal.science/hal-00185406
Submitted on : Tuesday, November 6, 2007-9:05:26 AM
Last modification on : Friday, March 24, 2023-2:52:49 PM
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- HAL Id : hal-00185406 , version 1
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Pascal Fouillat, Hervé Lapuyade, Yvan Maidon, Jean-Paul Dom. Analysis of Latchup susceptibility to internal logical states by using a Laser beam. Microelectronic Engineering, 1996, 31, pp.1. ⟨hal-00185406⟩
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