Validation of radiation hardened designs by pulsed laser testing and SPICE analysis - Archive ouverte HAL Access content directly
Journal Articles Microelectronics Reliability Year : 1999
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hal-00185404 , version 1 (06-11-2007)

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  • HAL Id : hal-00185404 , version 1

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Vincent Pouget, Dean Lewis, Hervé Lapuyade, Renaud Briand, Pascal Fouillat, et al.. Validation of radiation hardened designs by pulsed laser testing and SPICE analysis. Microelectronics Reliability, 1999, 39, pp.1. ⟨hal-00185404⟩
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