Journal Articles
Microelectronics Reliability
Year : 1999
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https://hal.science/hal-00185404
Submitted on : Tuesday, November 6, 2007-9:05:25 AM
Last modification on : Friday, March 24, 2023-2:52:49 PM
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- HAL Id : hal-00185404 , version 1
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Vincent Pouget, Dean Lewis, Hervé Lapuyade, Renaud Briand, Pascal Fouillat, et al.. Validation of radiation hardened designs by pulsed laser testing and SPICE analysis. Microelectronics Reliability, 1999, 39, pp.1. ⟨hal-00185404⟩
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