Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Microelectronics Reliability Année : 2003

Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects

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hal-00185396 , version 1 (06-11-2007)

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  • HAL Id : hal-00185396 , version 1

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Frédéric Darracq, Hervé Lapuyade, N. Buard, Pascal Fouillat, R. Dufayel, et al.. Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects. Microelectronics Reliability, 2003, 43, pp.1. ⟨hal-00185396⟩
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