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Article Dans Une Revue Microelectronics Reliability Année : 2004

Study of influence of failure modes on lifetime distribution prediction of 1.55 µm DFB laser diodes using weak drift of monitored parameters during ageing tests

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hal-00183946 , version 1 (30-10-2007)

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  • HAL Id : hal-00183946 , version 1

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Laurent Mendizabal, Laurent Bechou, Yannick Deshayes, Frédéric Verdier, Yves Danto, et al.. Study of influence of failure modes on lifetime distribution prediction of 1.55 µm DFB laser diodes using weak drift of monitored parameters during ageing tests. Microelectronics Reliability, 2004, 44, pp.1. ⟨hal-00183946⟩
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