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Communication Dans Un Congrès Année : 2003

Low frequency noise as early indicator of degradation in compound semiconductor FETs and HBTs

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hal-00183106 , version 1 (29-10-2007)

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  • HAL Id : hal-00183106 , version 1

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Nathalie Malbert, Cristell Maneux, Nathalie Labat, Andre Touboul. Low frequency noise as early indicator of degradation in compound semiconductor FETs and HBTs. 17th International Conference on Noise in Physical Systems and 1/f Fluctuations, 2003, Czech Republic. pp.767-773. ⟨hal-00183106⟩
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