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Article Dans Une Revue Microelectronics Reliability Année : 2004

Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors

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hal-00183088 , version 1 (29-10-2007)

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  • HAL Id : hal-00183088 , version 1

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Nathalie Labat, Nathalie Malbert, Cristell Maneux, Andre Touboul. Low frequency noise as a reliability diagnostic tool in compound semiconductor transistors. Microelectronics Reliability, 2004, 44, pp.1. ⟨hal-00183088⟩
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