The use of impedance spectroscopy, SEM and SAM imaging for early detection of failure in SMT assemblies - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 1997
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hal-00182923 , version 1 (29-10-2007)

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  • HAL Id : hal-00182923 , version 1

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Yves Ousten, Said Mejdi, Alain Fenech, Jean-Yves Deletage, Laurent Bechou, et al.. The use of impedance spectroscopy, SEM and SAM imaging for early detection of failure in SMT assemblies. 6th International Symposium on the physical and failure analysis of integrated circuits, (IPFA 97), 1997, Singapore. pp.1. ⟨hal-00182923⟩
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