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Communication Dans Un Congrès Année : 2002

Reliability Analysis of Tantalum Capacitors for High Temperature Application

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Dates et versions

hal-00182913 , version 1 (29-10-2007)

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  • HAL Id : hal-00182913 , version 1

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A. Dehbi, W. Wondrak, Yves Ousten, Yves Danto. Reliability Analysis of Tantalum Capacitors for High Temperature Application. CARTS Europe 2003: 17th Annual Passive Components Conference, 2002, France. pp.1. ⟨hal-00182913⟩
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