Characterization and reliability of quartz resonators submitted to high temperature - Archive ouverte HAL
Communication Dans Un Congrès Année : 2005

Characterization and reliability of quartz resonators submitted to high temperature

Fichier non déposé

Dates et versions

hal-00182900 , version 1 (29-10-2007)

Identifiants

  • HAL Id : hal-00182900 , version 1

Citer

Yves Ousten, Bruno Levrier, Grégory Andriamonje. Characterization and reliability of quartz resonators submitted to high temperature. CARTS Europe 2005: 19th Annual Passive Components Conference, 2005, Czech Republic. pp.196-209. ⟨hal-00182900⟩
83 Consultations
0 Téléchargements

Partager

More