Communication Dans Un Congrès Année : 2007

Turn-off failure mechanism analysis of Trench IGBT under clamped inductive switching operation

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hal-00180637 , version 1 (19-10-2007)

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  • HAL Id : hal-00180637 , version 1

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Adel Benmansour, Stephane Azzopardi, Jean-Christophe Martin, Eric Woirgard. Turn-off failure mechanism analysis of Trench IGBT under clamped inductive switching operation. European Conference on Power Electronics and Applications, Sep 2007, Aalborg, Denmark. pp.CD. ⟨hal-00180637⟩
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