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Article Dans Une Revue IEEE Transactions on Instrumentation and Measurement Année : 2003

An improved method for automatic detection and location of defects in electronics components using scanning ultrasonic microscopy

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hal-00180554 , version 1 (19-10-2007)

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  • HAL Id : hal-00180554 , version 1

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Laurent Bechou, Dominique Dallet, Yves Danto, Pasquale Daponte, Yves Ousten, et al.. An improved method for automatic detection and location of defects in electronics components using scanning ultrasonic microscopy. IEEE Transactions on Instrumentation and Measurement, 2003, 52 (1), pp.135-142. ⟨hal-00180554⟩
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