Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet Transform - Archive ouverte HAL
Article Dans Une Revue Measurement - Journal of the International Measurement Confederation (IMEKO) Année : 2002

Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet Transform

Domaines

Micro et nanotechnologies/Microélectronique

Dominique Dallet  : Connectez-vous pour contacter le contributeur

https://hal.science/hal-00180545

Soumis le : vendredi 19 octobre 2007-14:48:11

Dernière modification le : lundi 5 juin 2023-16:52:11

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Dates et versions

hal-00180545 , version 1 (19-10-2007)

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  • HAL Id : hal-00180545 , version 1

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Léopoldo Angrisani, Laurent Bechou, Dominique Dallet, Pasquale Daponte, Yves Ousten. Detection and location of defects in electronic devices by means of scanning ultrasonic microscopy and the wavelet Transform. Measurement - Journal of the International Measurement Confederation (IMEKO), 2002, 31 (2), pp.77-91. ⟨hal-00180545⟩

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