Automatic behavioral test pattern generation for digital circuits - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 1992

Automatic behavioral test pattern generation for digital circuits

Résumé

As complexity of circuits has increased and design techniques have evolved, testing them has evolved as well. This evolution has led to take into account high-level behavioral descriptions of circuits for generating their test patterns. The authors explain the reasons which have motivated research laboratory to become interested in behavioral generation. Having surveyed the representative work of the domain, the authors present their approach for generating test patterns from high-level behavioral descriptions
Fichier non déposé

Dates et versions

hal-00178663 , version 1 (11-10-2007)

Identifiants

Citer

Anne-Lise Courbis, Jean-François Santucci, Norbert Giambiasi. Automatic behavioral test pattern generation for digital circuits. First Asian Test Symposium, 1992. (ATS '92), 1992, Hiroshima, Japan. pp. 112-117, ⟨10.1109/ATS.1992.224447⟩. ⟨hal-00178663⟩
114 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More