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Article Dans Une Revue Microelectronics Reliability Année : 1998

The Use Impedance Spectroscopy, SEM and SAM Imaging for Early Detection of Failure in SMT Assemblies

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hal-00164931 , version 1 (24-07-2007)

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  • HAL Id : hal-00164931 , version 1

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Y. Ousten, S. Medji, A. Fenech, J. Y. Deletage, L. Bechou, et al.. The Use Impedance Spectroscopy, SEM and SAM Imaging for Early Detection of Failure in SMT Assemblies. Microelectronics Reliability, 1998, 38, pp. 1539-1545. ⟨hal-00164931⟩
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