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Article Dans Une Revue Quality and Reliability Engineering International Année : 1996

Nondestructive detection and localization of defects in multilayer ceramic chip capacitors using electromechanical resonances

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hal-00164916 , version 1 (24-07-2007)

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  • HAL Id : hal-00164916 , version 1

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L. Bechou, S. Mejdi, Y. Ousten, Y. Danto. Nondestructive detection and localization of defects in multilayer ceramic chip capacitors using electromechanical resonances. Quality and Reliability Engineering International, 1996, 12, pp.43-53. ⟨hal-00164916⟩
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