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Article Dans Une Revue EXACT INTERNATIONAL PUBLICATIONS FOR PASSIVE MANUFACTURERS Année : 1996

Nondestructive defect detection in multilayer ceramic chip capacitors using piezoelectric analysis and acoustic microscopy

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hal-00164912 , version 1 (24-07-2007)

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  • HAL Id : hal-00164912 , version 1

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L. Bechou, S. Mejdi, Y. Ousten, Y. Danto. Nondestructive defect detection in multilayer ceramic chip capacitors using piezoelectric analysis and acoustic microscopy. EXACT INTERNATIONAL PUBLICATIONS FOR PASSIVE MANUFACTURERS, 1996, pp. ⟨hal-00164912⟩
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