Strain mapping of V-groove InGaAs/GaAs strained quantum wires using cross sectional Atomic Force Microscopy - Archive ouverte HAL Access content directly
Journal Articles Applied Surface Science Year : 2000

Strain mapping of V-groove InGaAs/GaAs strained quantum wires using cross sectional Atomic Force Microscopy

F. Lelarge
  • Function : Author
C. Constantin
  • Function : Author
A. Rudra
  • Function : Author
K. Leifer
  • Function : Author
E. Kapon
  • Function : Author
No file

Dates and versions

hal-00158661 , version 1 (29-06-2007)

Identifiers

  • HAL Id : hal-00158661 , version 1

Cite

F. Lelarge, C. Priester, C. Constantin, A. Rudra, K. Leifer, et al.. Strain mapping of V-groove InGaAs/GaAs strained quantum wires using cross sectional Atomic Force Microscopy. Applied Surface Science, 2000, 166, pp.290-294. ⟨hal-00158661⟩
15 View
0 Download

Share

Gmail Facebook X LinkedIn More