Conference Papers
Year : 2000
Collection IEMN : Connect in order to contact the contributor
https://hal.science/hal-00157897
Submitted on : Wednesday, June 27, 2007-11:37:51 AM
Last modification on : Friday, March 24, 2023-2:52:49 PM
Dates and versions
Identifiers
- HAL Id : hal-00157897 , version 1
Cite
J.S. Goo, C.H. Choi, Francois Danneville, Z. Yu, T. Lee, et al.. Issues in high frequency noise simulation for deep submicron MOSFET's. 2000, pp.401-406. ⟨hal-00157897⟩
Collections
19
View
0
Download