Ferroelectric (116) SrBi2Nb2O9 thin films epitaxially grown by pulsed laser deposition on epitaxial (110) Pt/(110) SrTiO3 electrode
Résumé
Epitaxial SrBi2Nb2O9 thin films have been grown by pulsed-laser deposition on (110)Pt bottom electrode epitaxially grown on (110) SrTiO3 by dc sputtering. X-ray φ-scans and electron channeling patterns reveal the epitaxial growth of the (116) SrBi2Nb2O9/(110)Pt bilayers. The hysteresis loop, dielectric response, and capacitance–voltage characteristics of this bilayer are presented. The remnant polarization was measured to be close to 5 μC/cm2, and the coercive field was calculated to be ∼120 kV/cm. The zero field permittivity was about 150 and the dielectric loss was ∼2%.