Thermal characterisation of AlGaN/GaN HEMTs using micro-Raman scatering spectroscopy and pulsed I-V measurements

Raphaël Aubry; Jean-Claude Jacquet; Charu Dua; H. Gerard; B. Dessertenne; Marie-Antoinette Di Forte-Poisson; Yvon Cordier; Sylvain Laurent Delage

Conference Papers Year : 2003

Thermal characterisation of AlGaN/GaN HEMTs using micro-Raman scatering spectroscopy and pulsed I-V measurements

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Raphaël Aubry

Function : Author

Alcatel-Thalès III-V lab

Jean-Claude Jacquet

Function : Author

Alcatel-Thales III-V Lab

Charu Dua

Function : Author

H. Gerard

Function : Author

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

B. Dessertenne

Function : Author

Thomson-CSF Laboratoire Central de Recherches

Marie-Antoinette Di Forte-Poisson

Function : Author

Alcatel-Thalès III-V lab

Yvon Cordier

Function : Author
PersonId : 750365
IdHAL : yvon-cordier
ORCID : 0000-0003-3720-9409
IdRef : 128170794

Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520

CV

Sylvain Laurent Delage

Function : Author

THALES [France]

Domains

Engineering Sciences [physics]

Collection IEMN : Connect in order to contact the contributor

https://hal.science/hal-00146669

Submitted on : Tuesday, May 15, 2007-11:12:11 AM

Last modification on : Wednesday, January 24, 2024-9:54:18 AM

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hal-00146669 , version 1 (15-05-2007)

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HAL Id : hal-00146669 , version 1

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Raphaël Aubry, Jean-Claude Jacquet, Charu Dua, H. Gerard, B. Dessertenne, et al.. Thermal characterisation of AlGaN/GaN HEMTs using micro-Raman scatering spectroscopy and pulsed I-V measurements. International Conference on Silicon Carbide and Related Materials; ICSCRM2003, Oct 2003, Lyon, France. pp.1625-1628. ⟨hal-00146669⟩

Thermal characterisation of AlGaN/GaN HEMTs using micro-Raman scatering spectroscopy and pulsed I-V measurements

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