Conference Papers
Year : 2006
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https://hal.science/hal-00146654
Submitted on : Tuesday, May 15, 2007-11:06:24 AM
Last modification on : Friday, December 12, 2025-4:30:35 PM
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- HAL Id : hal-00146654 , version 1
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M. Ferrier, R. Clerc, L. Lucci, Gérard Ghibaudo, A. Vandooren, et al.. Saturation Drain Current analytical modeling of Single Gate Fully Depleted SOI or SON MOSFETs in the Quasi Ballistic Regime of Transport. 2006 IEEE International SOI Conference, 2006, Niagara Falls, United States. pp.XX. ⟨hal-00146654⟩
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