Conference Papers Year : 2006

Saturation Drain Current analytical modeling of Single Gate Fully Depleted SOI or SON MOSFETs in the Quasi Ballistic Regime of Transport

M. Ferrier
  • Function : Author
R. Clerc
L. Lucci
  • Function : Author
A. Vandooren
  • Function : Author
F. Boeuf
T. Skotnicki
  • Function : Author
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hal-00146654 , version 1 (15-05-2007)

Identifiers

  • HAL Id : hal-00146654 , version 1

Cite

M. Ferrier, R. Clerc, L. Lucci, Gérard Ghibaudo, A. Vandooren, et al.. Saturation Drain Current analytical modeling of Single Gate Fully Depleted SOI or SON MOSFETs in the Quasi Ballistic Regime of Transport. 2006 IEEE International SOI Conference, 2006, Niagara Falls, United States. pp.XX. ⟨hal-00146654⟩

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