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Communication Dans Un Congrès Année : 2003

Feedback of MEMS reliability study on the design stage : a step toward reliability aided design (RAD)

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hal-00146457 , version 1 (15-05-2007)

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  • HAL Id : hal-00146457 , version 1

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L. Buchaillot. Feedback of MEMS reliability study on the design stage : a step toward reliability aided design (RAD). 14th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis, ESREF 2003, 2003, Arcachon, France. ⟨hal-00146457⟩
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