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Communication Dans Un Congrès Intermetallics Année : 2007

Direct measurement of impurity effect on silicon undercooled by electromagnetic levitation

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hal-00142443 , version 1 (19-04-2007)

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  • HAL Id : hal-00142443 , version 1

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M. Beaudhuin, K. Zaidat, T. Duffar, M. Lemiti. Direct measurement of impurity effect on silicon undercooled by electromagnetic levitation. High Temperature Capillarity international Conference, 2007, Alicante, Spain. pp.845-855. ⟨hal-00142443⟩

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