Journal Articles
Microelectronics Reliability
Year : 2004
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https://hal.science/hal-00141958
Submitted on : Tuesday, April 17, 2007-8:33:52 AM
Last modification on : Friday, March 24, 2023-2:52:48 PM
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- HAL Id : hal-00141958 , version 1
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A. Sozza, C. Dua, E. Morvan, B. Grimbert, Virginie Hoel, et al.. Reliability investigation of gallium nitride HEMT microelectronics reliability. Microelectronics Reliability, 2004, 44, pp.1369-1373. ⟨hal-00141958⟩
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