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Journal Articles Microelectronics Reliability Year : 2004

Reliability investigation of gallium nitride HEMT microelectronics reliability

A. Sozza
  • Function : Author
C. Dua
  • Function : Author
E. Morvan
  • Function : Author
Virginie Hoel
S.L. Delage
  • Function : Author
N. Chaturvedi
  • Function : Author
R. Lossy
  • Function : Author
J. Wuerfl
  • Function : Author
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Dates and versions

hal-00141958 , version 1 (17-04-2007)

Identifiers

  • HAL Id : hal-00141958 , version 1

Cite

A. Sozza, C. Dua, E. Morvan, B. Grimbert, Virginie Hoel, et al.. Reliability investigation of gallium nitride HEMT microelectronics reliability. Microelectronics Reliability, 2004, 44, pp.1369-1373. ⟨hal-00141958⟩
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