Combined annealing temperature and thickness effects on properties of PbZr0.53Ti0.47O3 films on LaNiO3/Si substrate by sol-gel process - Archive ouverte HAL Access content directly
Journal Articles Journal of Crystal Growth Year : 2006

Combined annealing temperature and thickness effects on properties of PbZr0.53Ti0.47O3 films on LaNiO3/Si substrate by sol-gel process

Gang Wang
  • Function : Author
Caroline Soyer
No file

Dates and versions

hal-00138712 , version 1 (27-03-2007)

Identifiers

  • HAL Id : hal-00138712 , version 1

Cite

Gang Wang, Denis Remiens, Caroline Soyer. Combined annealing temperature and thickness effects on properties of PbZr0.53Ti0.47O3 films on LaNiO3/Si substrate by sol-gel process. Journal of Crystal Growth, 2006, 293, pp.370-375. ⟨hal-00138712⟩
27 View
0 Download

Share

Gmail Facebook X LinkedIn More