A non uniform thermal de-embedding approach for cryogenic on-wafer high frequency noise measurements - Archive ouverte HAL Access content directly
Conference Papers Year : 2004

A non uniform thermal de-embedding approach for cryogenic on-wafer high frequency noise measurements

S. Delcourt
  • Function : Author
Nour Eddine Bourzgui
Sylvie Lepilliet
C. Laporte
  • Function : Author
J.P. Fraysse
  • Function : Author
M. Maignan
  • Function : Author
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Dates and versions

hal-00133882 , version 1 (28-02-2007)

Identifiers

  • HAL Id : hal-00133882 , version 1

Cite

S. Delcourt, Gilles Dambrine, Nour Eddine Bourzgui, Sylvie Lepilliet, C. Laporte, et al.. A non uniform thermal de-embedding approach for cryogenic on-wafer high frequency noise measurements. 2004, pp.1809-1812. ⟨hal-00133882⟩
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