Journal Articles
IEEE Transactions on Electron Devices
Year : 2004
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https://hal.science/hal-00133871
Submitted on : Wednesday, February 28, 2007-9:35:02 AM
Last modification on : Wednesday, January 24, 2024-9:54:18 AM
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- HAL Id : hal-00133871 , version 1
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G. Pailloncy, C. Raynaud, M. Vanmackelberg, Francois Danneville, Sylvie Lepilliet, et al.. Impact of downscaling on high-frequency noise performance of bulk and SOI MOSFETs. IEEE Transactions on Electron Devices, 2004, 51, pp.1605-1612. ⟨hal-00133871⟩
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