Impact of downscaling on high-frequency noise performance of bulk and SOI MOSFETs - Archive ouverte HAL Access content directly
Journal Articles IEEE Transactions on Electron Devices Year : 2004

Impact of downscaling on high-frequency noise performance of bulk and SOI MOSFETs

C. Raynaud
M. Vanmackelberg
  • Function : Author
Francois Danneville
Sylvie Lepilliet
J.P. Raskin
  • Function : Author
Gilles Dambrine
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hal-00133871 , version 1 (28-02-2007)

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  • HAL Id : hal-00133871 , version 1

Cite

G. Pailloncy, C. Raynaud, M. Vanmackelberg, Francois Danneville, Sylvie Lepilliet, et al.. Impact of downscaling on high-frequency noise performance of bulk and SOI MOSFETs. IEEE Transactions on Electron Devices, 2004, 51, pp.1605-1612. ⟨hal-00133871⟩
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