"In situ time resolved X - ray diffraction coupled with thermal analyses to study mechanically activated SHS reaction : Case of the Nb - Al system" - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Materials Science and Engineering Année : 1999

"In situ time resolved X - ray diffraction coupled with thermal analyses to study mechanically activated SHS reaction : Case of the Nb - Al system"

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hal-00131159 , version 1 (15-02-2007)

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  • HAL Id : hal-00131159 , version 1

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V. Gauthier, F. Bernard, E. Gaffet, C. Josse, J.P. Larpin. "In situ time resolved X - ray diffraction coupled with thermal analyses to study mechanically activated SHS reaction : Case of the Nb - Al system". Materials Science and Engineering, 1999, 272 (2), pp.334 - 341. ⟨hal-00131159⟩
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