Truly quantitative XPS characterization of organic monolayers on silicon : study of alkyl and alkoxy monolayers on H-Si(111) - Archive ouverte HAL Accéder directement au contenu
Article Dans Une Revue Journal of the American Chemical Society Année : 2005

Truly quantitative XPS characterization of organic monolayers on silicon : study of alkyl and alkoxy monolayers on H-Si(111)

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hal-00125385 , version 1 (19-01-2007)

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  • HAL Id : hal-00125385 , version 1

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X. Wallart, C. Henry de Villeneuve, P. Allongue. Truly quantitative XPS characterization of organic monolayers on silicon : study of alkyl and alkoxy monolayers on H-Si(111). Journal of the American Chemical Society, 2005, 127, pp.7871. ⟨hal-00125385⟩
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