X-ray diffraction study of effect of deposition conditions on alpha-beta phase transition and stress evolution in sputter-deposited W coatings - Archive ouverte HAL
Article Dans Une Revue Chin. Phys. Soc. Année : 2006

X-ray diffraction study of effect of deposition conditions on alpha-beta phase transition and stress evolution in sputter-deposited W coatings

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hal-00097531 , version 1 (21-09-2006)

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  • HAL Id : hal-00097531 , version 1

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Cong Wang, Pascal Brault, Alain Pineau, Pascale Plantin, Anne Lise Thomann. X-ray diffraction study of effect of deposition conditions on alpha-beta phase transition and stress evolution in sputter-deposited W coatings. Chin. Phys. Soc., 2006, 15 (02), pp.432-436. ⟨hal-00097531⟩
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