Structural analysis of secondary ions by post-source decay in time-of-flight secondary ion mass spectrometry - Archive ouverte HAL
Article Dans Une Revue Rapid Communications in Mass Spectrometry Année : 2006

Structural analysis of secondary ions by post-source decay in time-of-flight secondary ion mass spectrometry

Domaines

Chimie organique

Dates et versions

hal-00018296 , version 1 (31-01-2006)

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David Touboul, Alain Brunelle, Olivier Laprévote. Structural analysis of secondary ions by post-source decay in time-of-flight secondary ion mass spectrometry. Rapid Communications in Mass Spectrometry, 2006, 20, pp.703-709. ⟨10.1002/rcm.2362⟩. ⟨hal-00018296⟩
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