Evaluation of SET and SEU effects at multiple abstraction levels - Archive ouverte HAL Accéder directement au contenu
Communication Dans Un Congrès Année : 2005

Evaluation of SET and SEU effects at multiple abstraction levels

Résumé

This paper reviews the main approaches used to evaluate the effect of single event transients and single event upsets in digital circuits described at different abstraction levels. The two fault models are first discussed with respect to the circuit description levels, then complementary dependability evaluation methods are summarized.
Fichier non déposé

Dates et versions

hal-00015000 , version 1 (01-12-2005)

Identifiants

Citer

Lorena Anghel, Régis Leveugle, Pierre Vanhauwaert. Evaluation of SET and SEU effects at multiple abstraction levels. 11th-IEEE-International-On-Line-Testing-Symposium., 2005, French Riviera, France. pp.309-12, ⟨10.1109/IOLTS.2005.28⟩. ⟨hal-00015000⟩

Collections

UGA CNRS TIMA
158 Consultations
0 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More