Quantitative analysis of the critical current due to vortex pinning by surface corrugation. - Archive ouverte HAL Accéder directement au contenu
Pré-Publication, Document De Travail Année : 2004

Quantitative analysis of the critical current due to vortex pinning by surface corrugation.

Résumé

The transport critical current of a Niobium (Nb) thick film has been measured for a large range of magnetic field. Its value and variation are quantitatively described in the framework of the pinning of vortices due to boundary conditions at the rough surface, with a contact angle well explained by the spectral analysis of the surface roughness. Increasing the surface roughness using a Focused Ion Beam results also in an increase of the superficial critical current.
Fichier principal
Vignette du fichier
fib3.pdf (108.15 Ko) Télécharger le fichier
Loading...

Dates et versions

hal-00001451 , version 1 (14-04-2004)

Identifiants

Citer

Alain Pautrat, J. Scola, C. Goupil, Ch. Simon, C. Villard, et al.. Quantitative analysis of the critical current due to vortex pinning by surface corrugation.. 2004. ⟨hal-00001451⟩
250 Consultations
235 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More