index - PCM Accéder directement au contenu

Derniers dépôts

Chargement de la page

Rechercher

Nombre de documents

77

Nombre de notices

276

Mots-clés

A-CNx Carbon Nanotube Sputtering Capacitance Colloidal solution NEXAFS Bixbyite Aryl-diazonium salts Band gap Spectroscopic ellipsometry TEM 3 nm in size Band alignment TiO2 CHLORINE PLASMAS Atomic force microscopy Mott insulators Residual stress Ablation laser Calcined clay B Chemical synthesis Physical vapor deposition Biomasse Nanocomposite Thin film B1 Inorganic compounds Amorphous Scanning electron microscopy Optical properties Thin films A Thin films XPS B3 Solar cells Carbon nitride Cathepsin Etching Buffer Couple Chemical detection X-ray photoelectron spectroscopy CIGSe A3 Physical vapor deposition processes Non-volatile memory AZO thin films B2 Semiconducting alloys B2 Quaternary Chalcogenides Resistive switching Alloying Biofilms microbiens AlN Amyloid precursor Plasmas froids Plasma etching Chalcogenide V2O3 PECVD Copper Anatase Nanotubes Magnetron sputtering Atomic layer etching Oxides Semiconductors Applications industrielles BOMBARDMENT Alzheimer's disease Structure A Chalcogenides Films Ambipolar material SF 6 CH4 Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation Mott insulator Chemical and biological sensors CaTiO3Pr^3^+ A1 Characterization B2 Semiconducting indium compounds Carbon nanotubes X-ray diffraction C Photoelectron spectroscopy Selenization Low-pressure plasma processing Avalanche breakdown Transmission electron microscopy CNTs’ collapse Biocapteurs Adsorption Aluminium nitride Bipolar resistive switching BRS Chalcogenide glass A Multilayers Vanadium Sesquioxide AuCu alloy Sol-gel Titanium dioxide Transfert d'énergie Functionalization Kirkendall effect Carbon