Light scattering features induced by residual layers in dielectric dewetted nanoparticles
Résumé
Abstract: All-dielectric, sub-micrometric particles obtained through solid state dewetting
of thin SiGe-films have been shown to support Mie resonances together with a high-quality
monocrystalline composition and atomically smooth facets. Recently, a precise study on the
impact given by the effective complex morphology of a SiGe dewetted nanoparticle to the Mie
scattering properties has been provided and carried on through a novel experimental technique
called Dark-field Scanning Optical Microscopy. In this work, by means of the same experimental
technique and numerical simulations of light scattering, we show how the presence of a pedestal
enriched with silicon placed under the SiGe-nanoparticle results in a sharp peak at high energy
in the total scattering cross-section. Exploiting a tilted illumination to redirect scattered light, we
are able to discriminate the spatial localization of the pedestal-induced resonance. Our results
contribute to extending the practical implementations of dewetted Mie resonators in the field of
light scattering directionality, sensing applications and show further engineering options beyond
the simple isolated-island case.
Domaines
Physique [physics]
Fichier principal
Nicoletta Granchi Opt. Mater. Express 13(11) 3355-3364 (2023).pdf (3.82 Mo)
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Origine | Publication financée par une institution |
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