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Obsolescence in EMC Risk Assessment: A Case Study on EFT Immunity of Microcontrollers

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hal-02749814 , version 1 (31-05-2021)

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Qazi Mashaal Khan, Mohsen Koohestani, Mohamed Ramdani, Richard Perdriau. Obsolescence in EMC Risk Assessment: A Case Study on EFT Immunity of Microcontrollers. International Symposium on Electromagnetic Compatibility (EMC Europe 2020), Sep 2020, Rome (virtual conference), Italy. ⟨10.1109/EMCEUROPE48519.2020.9245783⟩. ⟨hal-02749814⟩
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