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Conference Papers Year : 2012

Design of a 20 GHz DPI method for SOIC8

Richard Perdriau
Mohamed Ramdani
Frédéric Lafon
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The direct power injection (DPI) test defined in IEC 62132-4 measures the conducted immunity of integrated circuits (ICs) up to 1GHz. As the frequency of functional and interference signals is increasing, we would like to characterise immunity for higher frequencies as well. In this paper, we show why typical IEC 62132-4 compliant DPI set-ups become inaccurate when going up to 20GHz. We propose to determine the power Ptrans actually transmitted to the device under test (DUT) by using offline short-open-load-thru (SOLT) or thru-reflect-line (TRL) calibration. Furthermore, we design a low-cost FR4 printed circuit board (PCB) that allows for testing of SOIC8-packaged ICs. We verify that this board has acceptable and reproducible losses up to 20 GHz, as well as acceptable crosstalk.
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hal-00776483 , version 1 (15-01-2013)



Sjoerd Op 'T Land, Richard Perdriau, Mohamed Ramdani, Ignacio Gil, Frédéric Lafon, et al.. Design of a 20 GHz DPI method for SOIC8. Electromagnetic Compatibility (EMC EUROPE), 2012 International Symposium on, Sep 2012, Rome, Italy. pp.1-6, ⟨10.1109/EMCEurope.2012.6396691⟩. ⟨hal-00776483⟩
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