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Conference Papers Year : 2007

Predicting the Immunity of integrated circuits through Measurement Methods and Simulation Models

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Dates and versions

hal-00540904 , version 1 (29-11-2010)

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  • HAL Id : hal-00540904 , version 1

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Ali Alaeldine, Jérôme Cordi, Richard Perdriau, Mohamed Ramdani, Jean-Luc Levant. Predicting the Immunity of integrated circuits through Measurement Methods and Simulation Models. EMC Zurich, Sep 2007, Zurich, Switzerland. pp.79-82. ⟨hal-00540904⟩
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