Conference Papers
Year : 2007
Yolande Sambin : Connect in order to contact the contributor
https://hal.science/hal-00540904
Submitted on : Monday, November 29, 2010-2:30:40 PM
Last modification on : Wednesday, April 27, 2022-4:24:03 AM
Dates and versions
Identifiers
- HAL Id : hal-00540904 , version 1
Cite
Ali Alaeldine, Jérôme Cordi, Richard Perdriau, Mohamed Ramdani, Jean-Luc Levant. Predicting the Immunity of integrated circuits through Measurement Methods and Simulation Models. EMC Zurich, Sep 2007, Zurich, Switzerland. pp.79-82. ⟨hal-00540904⟩
Collections
317
View
0
Download