A Direct Power Injection Model for Immunity Prediction in Integrated Circuits - Archive ouverte HAL Access content directly
Journal Articles IEEE Transactions on Electromagnetic Compatibility Year : 2008

A Direct Power Injection Model for Immunity Prediction in Integrated Circuits

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Richard Perdriau
Mohamed Ramdani
Jean-Luc Levant
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Abstract

This paper introduces a complete simulation model of a Direct Power Injection (DPI) setup, used to measure the immunity of integrated circuits to conducted continuous-wave interference. This model encompasses the whole measurement setup itself as well as the integrated circuit under test and its environment (printed circuit board, power supply). Furthermore, power losses are theoretically computed, and the most significant ones are included in the model. Therefore, the injected power level causing a malfunction of an integrated circuit, according to a given criterion, can be identified and predicted at any frequency up to 1 GHz. In addition to that, the relationship between immunity and impedance is illustrated. Simulation results obtained from the model are compared to measurement results and demonstrate the validity of this approach.
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Dates and versions

hal-00316535 , version 1 (07-09-2008)

Identifiers

  • HAL Id : hal-00316535 , version 1

Cite

Ali Alaeldine, Richard Perdriau, Mohamed Ramdani, Jean-Luc Levant. A Direct Power Injection Model for Immunity Prediction in Integrated Circuits. IEEE Transactions on Electromagnetic Compatibility, 2008, 50, pp.52-62. ⟨hal-00316535⟩
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