Large scale and wide band dielectric characterization of oxide and oxynitride strontium and tantalum-based perovskite ceramics and thin films - Archive ouverte HAL Access content directly
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Large scale and wide band dielectric characterization of oxide and oxynitride strontium and tantalum-based perovskite ceramics and thin films

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hal-01148560 , version 1 (04-05-2015)

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  • HAL Id : hal-01148560 , version 1

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Simon Jacq, Claire Le Paven-Thivet, A. Ferri, Vincent Laur, Ratiba Benzerga, et al.. Large scale and wide band dielectric characterization of oxide and oxynitride strontium and tantalum-based perovskite ceramics and thin films. European Materials Research Society - EMRS 2015, May 2015, Lille, France. ⟨hal-01148560⟩
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