Conference Papers
Year : 2019
Xavier Castel : Connect in order to contact the contributor
https://hal.science/hal-02133623
Submitted on : Sunday, May 19, 2019-11:12:53 AM
Last modification on : Wednesday, April 27, 2022-4:19:43 AM
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- HAL Id : hal-02133623 , version 1
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Barthélemy Aspe, Fatou Cissé, Xavier Castel, Stéphanie Députier, Valérie Demange, et al.. Substrate influence on structural and dielectric properties at microwaves of KNN thin films on R-cut sapphire and (100) MgO. E-MRS 2019 Spring Meeting “European Material Research Society”, May 2019, Nice, France. 1 pp. ⟨hal-02133623⟩
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