Substrate influence on structural and dielectric properties at microwaves of KNN thin films on R-cut sapphire and (100) MgO - Archive ouverte HAL Access content directly
Conference Papers Year : 2019

Substrate influence on structural and dielectric properties at microwaves of KNN thin films on R-cut sapphire and (100) MgO

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Damien Passerieux
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Dates and versions

hal-02133623 , version 1 (19-05-2019)

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  • HAL Id : hal-02133623 , version 1

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Barthélemy Aspe, Fatou Cissé, Xavier Castel, Stéphanie Députier, Valérie Demange, et al.. Substrate influence on structural and dielectric properties at microwaves of KNN thin films on R-cut sapphire and (100) MgO. E-MRS 2019 Spring Meeting “European Material Research Society”, May 2019, Nice, France. 1 pp. ⟨hal-02133623⟩
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