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Structure: Internal structure identifier : 44470
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Advantages of Using Feature Selection Techniques on Steganalysis Schemes

Yoan Miche , Patrick Bas , Christian Jutten , Amaury Lendasse , Olli Simula et al.
IWANN 2007 - 9th International Work-Conference on Artificial Neural Networks, Jun 2007, San Sebastian, Spain. pp.electronic version
Conference papers hal-00166695v1
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Reliable Steganalysis Using a Minimum Set of Samples and Features

Yoan Miche , Patrick Bas , Christian Jutten , Amaury Lendasse , Olli Simula et al.
EURASIP Journal on Information Security, 2009, 2009, pp.ID 901381. ⟨10.1155/2009/901381⟩
Journal articles hal-00437868v1
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Une methodologie pour la selection de variables pour la steganalyse

Yoan Miche , Patrick Bas , Amaury Lendasse , Christian Jutten , Olli Simula et al.
Traitement du Signal, 2009, 26 (1), pp.13-30
Journal articles hal-00437891v1

OP-ELM: Optimally-Pruned Extreme Learning Machine

Yoan Miche , Patrick Bas , Christian Jutten , Amaury Lendasse , Olli Simula et al.
IEEE Transactions on Neural Networks, 2009, 21 (1), pp.158-162. ⟨10.1109/TNN.2009.2036259⟩
Journal articles hal-00541415v1
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Extracting relevant features of steganographic schemes by feature selection techniques

Yoan Miche , Patrick Bas , Christian Jutten , Amaury Lendasse , Olli Simula et al.
WaCHa 2007 - Third Wavila Challenge, Jun 2007, Saint-Malo, France. pp.electronic version
Conference papers hal-00166700v1
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Avantages de la Sélection de Caractéristiques pour la Stéganalyse

Yoan Miche , Patrick Bas , Amaury Lendasse , Olli Simula , Christian Jutten et al.
GRETSI 2007 - XXIème Colloque francophone de traitement du signal et des images, Sep 2007, Troyes, France. pp.electronic version
Conference papers hal-00166692v1