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Document type : Books
labStructName_t : Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation

A rigorous analysis of the parameters which govern the SILC in n-channel MOSFET's with oxide thickness in the 1-2 nm range

D. Bauza
in 'MOSFETs: Properties, Preparations and Performance', Novapublishers, New York-USA (ISBN 978-1-60456-762-5). in 'MOSFETs: Properties, Preparations and Performance', Novapublishers, New York-USA (ISBN 978-1-60456-762-5), 2008
Books hal-00391851v1

Optoélectronique térahertz

N. Breuil , Laurent Chusseau , J.-L. Coutaz , P. Crozat , J. Demaison , et al.
Coutaz, Jean-Louis. EDP Sciences, pp.360, 2008, 978-2-86883-975-6
Books hal-00393993v1