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Time dependent resistance switching in HfO2 probed under a constant voltage stress mode

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hal-00669537 , version 1 (13-02-2012)

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  • HAL Id : hal-00669537 , version 1

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C. Mannequin, P. Gonon, Corentin Vallée, A. Salaün, V. Jousseaume, et al.. Time dependent resistance switching in HfO2 probed under a constant voltage stress mode. 2012 MRS Spring Meeting, Apr 2012, San Francisco, United States. ⟨hal-00669537⟩
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