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Communication Dans Un Congrès Année : 2011

Mean time to failure distribution in thin oxide film: Observation at nano and devices scale and modelling using a filamentary growth model

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hal-00649930 , version 1 (09-12-2011)

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  • HAL Id : hal-00649930 , version 1

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P. Delcroix, S. Blonkowski, M. Kogelschatz, M. Rafik. Mean time to failure distribution in thin oxide film: Observation at nano and devices scale and modelling using a filamentary growth model. SSDM Conference, Sep 2011, Nagoya, Japan. ⟨hal-00649930⟩
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