ESD robustness of FDSOI gated diode for ESD network design: thin or thick BOX? - Archive ouverte HAL Access content directly
Conference Papers Year : 2010

ESD robustness of FDSOI gated diode for ESD network design: thin or thick BOX?

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hal-00604644 , version 1 (29-06-2011)

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  • HAL Id : hal-00604644 , version 1

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T. Benoist, C. Fenouillet-Beranger, P. Perreau, C. Buj, P. Galy, et al.. ESD robustness of FDSOI gated diode for ESD network design: thin or thick BOX?. 2010 IEEE International SOI Conference, Oct 2010, San Diego, California, United States. ⟨hal-00604644⟩
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