Conference Papers
Year : 2010
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https://hal.science/hal-00604644
Submitted on : Wednesday, June 29, 2011-2:10:44 PM
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- HAL Id : hal-00604644 , version 1
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T. Benoist, C. Fenouillet-Beranger, P. Perreau, C. Buj, P. Galy, et al.. ESD robustness of FDSOI gated diode for ESD network design: thin or thick BOX?. 2010 IEEE International SOI Conference, Oct 2010, San Diego, California, United States. ⟨hal-00604644⟩
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