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Communication Dans Un Congrès Année : 2007

Statistics of electrical breakdown in high-K materials from millimeter to nanometer length scales: macroscopic testing vs. conductive-AFM

C. Sire
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Dates et versions

hal-00396816 , version 1 (18-06-2009)

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  • HAL Id : hal-00396816 , version 1

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C. Sire, S. Blonkowski, M. Gordon, T. Baron. Statistics of electrical breakdown in high-K materials from millimeter to nanometer length scales: macroscopic testing vs. conductive-AFM. MRS Fall Meeting, Nov 2007, Boston, United States. ⟨hal-00396816⟩
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