ESREF 2025 Proceedings
This international symposium continues to focus on recent developments and future directions in Quality and Reliability Management of materials, devices and circuits for micro-, nano-, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
Session A - Quality and Reliability assessment techniques and methods for Devices and Systems
Session B - Semiconductor Failure Mechanisms & Reliability for Si technologies & Nanoelectronics
Session C - Progress in Failure Analysis: Defect Detection and Analysis
Session D - Reliability of Microwave devices and circuits
Session E - Packaging and Assembly : Reliability and Failure Analysis
Session F1 - Smart-power devices, IGBT, thyristors
Session F2 - SiC and GaN power devices
Session F3 - Power Electronic System
Session G - Photonics Reliability
Session H - MEMS and sensors Reliability
Link to ESREF 2025 Website
